Sandia National Laboratories Installs kSA ICE Tool
Sandia National Laboratories recently installed a kSA ICE tool on a modified EMCORE D-125 MOCVD reactor. The kSA Integrated Control for Epitaxy (kSA ICE) tool is a modular in situ metrology system capable of measuring multi-wafer real-time temperature, reflectivity, growth rate, film stress and substrate curvature during MOCVD processes.
Sandia's system also features reflectivity at a wavelength of 405 nm, in addition to reflectivity at longer wavelengths of 660 and 960 nm.